Transmission electron microscopes (TEM’s) provide very high-resolution images that can, in some circumstances, achieve atomic resolution. A particularly informative mode of TEM operation forms images of defects in crystalline materials by local changes in the diffraction conditions (diffraction contrast). By systematic application of this technique, not only can images be formed, but also determination of some properties of the defect can be achieved through careful image analysis. Electron diffraction patterns can be routinely recorded. As with all TEM’s, careful specimen preparation is required to obtain meaningful results.
The Philips CM30 TEM (300KV) available in the Electron Microscope Facility is a moderately high voltage general-purpose instrument that is optimized for the study of inorganic materials. It has, on occasion, been used for biological materials with good results. It has both single and double axis tilt stages. Hot and cold (Liq. Nitrogen) stages are available. A large number of research projects have made use of this instrument.
Images ranging from the nature of interfaces in electronic devices to the discovery of anti-phase domain boundaries in magnetic oxides have been.
For more information regarding the ESEM cost, using the facility or general ESEM questions please contact Ryan Anderson (858) 822-5663, (email) ryan@ece.ucsd.edu.
For more information regarding the TEM cost, using the facility or general TEM questions please contact Lea Rudee (858) 534-8998, (email) rudee@ucsd.edu.